Ms Jeannie Heffernan > Kirkland & Ellis LLP > New York, United States > Lawyer Profile

Kirkland & Ellis LLP
NEW YORK, NY 10022
United States
Jeannie Heffernan photo


Jeannie Heffernan is an experienced trial lawyer focusing on patent and trademark infringement litigation. Jeannie has successfully tried more than a dozen patent and trademark infringement cases around the United States in a wide range of industries, from medical devices to telecommunications to haute couture.




University of Chicago Law School, J.D., 2002 (George B. Pletsch Scholar and Editor in Chief, Chicago Journal of International Law); University of Chicago, A.M., Divinity, 1994 (Merit Scholar); University of Notre Dame, B.A., Program of Liberal Studies and French, 1992 (magna cum laude, Phi Beta Kappa); Universite Catholique de l’Ouest, Angers, France, Diplome d’Etudes de Niveau Superieur, 1990.

Lawyer Rankings

United States > Intellectual property > Patents: litigation (full coverage)

Kirkland & Ellis LLP houses a stellar bench of experienced trial lawyers, including the New York-based Gregory Arovas, Robert Appleby, Joseph Loy, and Todd Friedman; James Hurst, Amanda Hollis, and Bryan Hales in Chicago; Michael De Vries and Ellisen Turner in Los Angeles; Adam Alper in San Francisco; Gregg LoCascio and John O’Quinn in Washington DC; and Jeannie Heffernan in Austin. Operating across the country, the practice is a preferred choice for major industry clients for a wide gamut of patent disputes, litigating cases before district courts, the Federal Circuit, the ITC, the PTAB, and the Supreme Court. The group has particular expertise in the semiconductor, telecommunications, technology, electronics and pharmaceutical industries.